SP324 RF Spot Probes – Lab Quality Materials Measurements in a Small Package
This paper introduces a new, non-traditional, measurement method for obtaining complex dielectric properties at UHF and VHF frequencies.
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This paper introduces a new, non-traditional, measurement method for obtaining complex dielectric properties at UHF and VHF frequencies.
This paper introduces a new, non-traditional, measurement method for obtaining complex dielectric properties at UHF and VHF frequencies.
n this paper, Compass Technology Group presents a new method for measuring thin polymer sheets using a slotted R-Coax Line.
This paper presents a new flat lens antenna technology, enabling significant reductions in size & weight compared to wide bandwidth horn antennas.
This paper provides several new corrections that improve the loss tangent accuracy of free space methods over an order of magnitude.
In this paper, the Compass Technology Group team presents an non-destructive testing (NDT) method for detecting mechanical defects in radomes.
This paper depicts using wide-band probes to interrogate a small area of a material or component & determine reflection or transmission properties
Comparing two free-space extraction algorithms developed for the extraction of complex permittivity & permeability from metal-backed reflection.
This article discusses the concept of a hand-held reflectometer system for the measurement of microwave relevant materials.
This paper describes a new correction method, which determines and corrects for phase and amplitude errors in transmission line cables.